J Korean Acad Prosthodont.  2012 Jul;50(3):169-175. 10.4047/jkap.2012.50.3.169.

Brazing characteristics of ZrO2 and Ti-6Al-4V brazed joints with increasing temperature

• Kee SH
• Park SY
• Heo YK
• Jung JP
• Kim WJ

• KMID: 2000205
• DOI: http://doi.org/10.4047/jkap.2012.50.3.169

Abstract

PURPOSE
In this study, brazing characteristics of ZrO2 and Ti-6Al-4V brazed joints with increasing temperature were investigated.
MATERIALS AND METHODS
The sample size of the ZrO2 was 3 mm x 3 mm x 3 mm (thickness), and Ti-6Al-4V was 10 mm (diameter) x 5 mm (thickness). The filler metal consisted of Ag-Cu-Sn-Ti was prepared in powder form. The brazing sample was heated in a vacuum furnace under 5 x 10(-6) torr atmosphere, while the brazing temperature was changed from 700 to 800degrees C for 30 min.
RESULTS
The experimental results shows that brazed joint of ZrO2 and Ti-6Al-4V occurred at 700 - 800degrees C. Brazed joint consisted of Ag-rich matrix and Cu-rich phase. A Cu-Ti intermetallic compounds and a Ti-Sn-Cu-Ag alloy were produced along the Ti-6Al-4V bonded interface. Thickness of the reacted layer along the Ti-6Al-4V bonded interface was increased with brazing temperature. Defect ratios of ZrO2 and Ti-6Al-4V bonded interfaces decreased with brazing temperature.
CONCLUSION
Thickness and defect ratio of brazed joints were decreased with increasing temperature. Zirconia was not wetting with filler metal, because the reaction between ZrO2 and Ti did not occur enough.

Keyword

Dental implant; Active metal brazing; Joining; Titanium

MeSH Terms

Alloys
Atmosphere
Dental Implants
Hot Temperature
Joints
Sample Size
Titanium
Vacuum
Zirconium
Alloys
Dental Implants
Titanium
Zirconium

Figure

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  Fig. 1 Schematic of brazing sample.

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  Fig. 2 Thickness and defect ratio with increasing temperature. A: Thickness, B: Defect ratio.

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  Fig. 3 ZrO2/Ti alloy brazing sample.

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  Fig. 4 SEM images of ZrO2/Filler metal/Ti alloy interface at, (A) 700℃, (B) 750℃, (C) 800℃ for 30 min.

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  Fig. 5 (A) Enlarged SEM image at filler metal/Ti-6Al-4V interface with (B) EDS line scanning profile for the diffusion layer at 750℃.

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  Fig. 6 EDS mapping for the interface at, (A) 700℃, (B) 750℃, (C) 800℃.

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  Fig. 7 XRD Analysis for the interface at, (A) 700℃, (B) 750℃, (C) 800℃.

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  Fig. 8 Cu-Ti phase diagram.

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  Fig. 9 SEM Images of (A) defect in ZrO2/filler metal and (B) enlarged SEM Image at 700℃.

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