Imaging Sci Dent.  2023 Sep;53(3):217-220. 10.5624/isd.20230039.

A pilot study of half-value layer measurements using a semiconductor dosimeter for intraoral radiography

• Nouchi S
• Yoshida H
• Miki Y
• Tezuka Y
• Ogawa R
• Ogura I

• KMID: 2546694
• DOI: http://doi.org/10.5624/isd.20230039

Abstract

Purpose
This pilot study was conducted to evaluate half-value layer (HVL) measurements obtained using a semi conductor dosimeter for intraoral radiography.
Materials and Methods
This study included 8 aluminum plates, 4 of which were low-purity (less than 99.9%) and 4 high-purity (greater than 99.9%). Intraoral radiography was performed using an intraoral X-ray unit in accordance with the dental protocol at the authors’ affiliated hospital: tube voltage, 60 kVp and 70 kVp; tube current, 7 mA; and exposure time, 0.10 s. The accuracy of HVL measurements for intraoral radiography was assessed using a semiconductor dosimeter. A simple regression analysis was performed to compare the aluminum plate thickness and HVL in relation to the tube voltage (60 kVp and 70 kVp) and aluminum purity (low and high).
Results
For the low-purity aluminum plates, the HVL at 60 kVp (Y) and 70 kVp (Y) was significantly correlated with the thickness of the aluminum plate (X), with Y = 1.708 + 0.415X (r = 0.999, P<0.05) and Y = 1.980 + 0.484X (r = 0.999, P<0.05), respectively. Similarly, for the high-purity aluminum plates, the HVL at 60 kVp (Y) and 70 kVp (Y) was significantly correlated with the plate thickness (X), with Y = 1.696 + 0.454X (r = 0.999, P<0.05) and Y = 1.968 + 0.515X (r = 0.998, P<0.05), respectively.
Conclusion
This pilot study examined the relationship between aluminum plate thickness and HVL measurements using a semiconductor dosimeter for intraoral radiography. Semiconductor dosimeters may prove useful in HVL measurement for purposes such as quality assurance in dental X-ray imaging.

Keyword

Radiography, Dental; Quality Assurance, Health Care; Radiation Exposure; Radiation Dosimeters