Ferreira A, Cravo M
Choi KS, Suh M
Jung HY, Ahn JY
Ko BM
Ryu JK
Bae SI, Kim YS
Choi IJ
Jang HH, Kim HW, Kim SJ, Choi CW, Park SB, Song BJ, Shin DH, Kang DH
Park JY, von Karsa , Herrero R
Lee SW, Lee JH, Cho H, Ha Y, Lim H, Ahn JY, Choi KS, Kim DH, Choi KD, Song HJ, Lee GH, Jung HY, Kim JH
Pyeon SI, Hwang JH, Kim YT, Lee BS, Lee SH, Lee JN, Cheong JH, Oh KJ
Nicholson , Acra SA, Chung DH, Rosen MJ
Edriss H, El-Bakush , Nugent K
Park SY, Moon HS, Seong JK, Jeong HY, Yoon BY, Hwang SW, Song KS
Lim DH, Ahn JY, Seo M, Yun JH, Kim TH, Jung HY, Kim JH, Park YS
Navaneethan U, Gutierrez , Jegadeesan R, Venkatesh , Poptic E, Sanaka MR, Vargo JJ, Parsi MA
Ahn SY, Jang SI, Lee DW, Jeon SW
Kwon CI, Kim G, Chung IK, Kim WH, Ko KH, Hong SP, Jeong S, Lee DH
Cho JW, Choi SC, Jang JY, Shin SK, Choi KD, Lee JH, Kim SG, Sung JK, Jeon SW, Choi IJ, Kim GH, Jee SR, Lee WS, Jung HY, Korean ESD Study Group
Kim GH, Jee SR, Jang JY, Shin SK, Choi KD, Lee JH, Kim SG, Sung JK, Choi SC, Jeon SW, Jang BI, Huh KC, Chang DK, Jung SA, Keum B, Cho JW, Choi IJ, Jung HY, Korean ESD Study Group